M.R Shaneyfelt : rechercher sur Z-Library

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1

Proton- and Gamma-Induced Effects on Erbium-Doped Optical Fibers

Girard, S., Tortech, B., Regnier, E., Van Uffelen, M., Gusarov, A., Ouerdane, Y., Baggio, J., Paillet, P., Ferlet-Cavrois, V., Boukenter, A., Meunier, J.-P., Berghmans, F., Schwank, J. R., Shaneyfelt,

Journal:

IEEE Transactions on Nuclear Science

Année:

2007

Langue:

english

Fichier:

PDF, 1.10 MB

english, 2007

2

Effects of oxide traps, interface traps, and ââborder trapsââ on metal-oxide-semiconductor devices

Fleetwood, D. M., Winokur, P. S., Reber, R. A., Meisenheimer, T. L., Schwank, J. R., Shaneyfelt, M. R., Riewe, L. C.

Journal:

Journal of Applied Physics

Année:

1993

Langue:

english

Fichier:

PDF, 2.84 MB

english, 1993

3

Test Procedures for Proton-Induced Single Event Latchup in Space Environments

Felix, James A., Schwank, James R., Shaneyfelt, Marty R., Baggio, Jacques, Paillet, Philippe, Ferlet-Cavrois, Veronique, Dodd, Paul E., Girard, Sylvain, Blackmore, Ewart W.

Journal:

IEEE Transactions on Nuclear Science

Année:

2008

Langue:

english

Fichier:

PDF, 131 KB

english, 2008

4

Art in Italy || A Reappraisal of Giannicola Di Paolo's Early Career

Sheri Francis Shaneyfelt

Journal:

The Burlington Magazine

Année:

2007

Langue:

english

Fichier:

PDF, 1.14 MB

english, 2007

5

The Società del 1496: Supply, Demand, and Artistic Exchange in Renaissance Perugia

Shaneyfelt, Sheri Francis

Journal:

The Art Bulletin

Année:

2015

Langue:

english

Fichier:

PDF, 3.36 MB

english, 2015

6

Pyramids are guides not rules: the evolution of the evidence pyramid

Shaneyfelt, Terrence

Journal:

Evidence-Based Medicine

Année:

2016

Langue:

english

Fichier:

PDF, 260 KB

english, 2016

7

Border traps: Issues for MOS radiation response and long-term reliability

D.M. Fleetwood, M.R. Shaneyfelt, W.L. Warren, J.R. Schwank, T.L. Meisenheimer, P.S. Winokur

Journal:

Microelectronics Reliability

Année:

1995

Langue:

english

Fichier:

PDF, 1.17 MB

english, 1995

8

Effects of radiation and charge trapping on the reliability of high-κ gate dielectrics

J.A Felix, J.R Schwank, D.M Fleetwood, M.R Shaneyfelt, E.P Gusev

Journal:

Microelectronics Reliability

Année:

2004

Langue:

english

Fichier:

PDF, 371 KB

english, 2004

9

Influence of total-dose radiation on the electrical characteristics of SOI MOSFETs

J.A. Felix, J.R. Schwank, C.R. Cirba, R.D. Schrimpf, M.R. Shaneyfelt, D.M. Fleetwood, P.E. Dodd

Journal:

Microelectronic Engineering

Année:

2004

Langue:

english

Fichier:

PDF, 503 KB

english, 2004

10

Non-volatile memory device based on mobile protons in SiO2 thin films

Vanheusden, K., Warren, W. L., Devine, R. A. B., Fleetwood, D. M., Schwank, J. R., Shaneyfelt, M. R., Winokur, P. S., Lemnios, Z. J.

Journal:

Année:

1997

Fichier:

PDF, 851 KB

1997

11

Impact of Heavy Ion Energy and Nuclear Interactions on Single-Event Upset and Latchup in Integrated Circuits

Dodd, P. E., Schwank, J. R., Shaneyfelt, M. R., Felix, J. A., Paillet, P., Ferlet-Cavrois, V., Baggio, J., Reed, R. A., Warren, K. M., Weller, R. A.

Journal:

IEEE Transactions on Nuclear Science

Année:

2007

Langue:

english

Fichier:

PDF, 233 KB

english, 2007

12

Radiation Effects in MOS Oxides

Schwank, James R., Shaneyfelt, Marty R., Fleetwood, Daniel M., Felix, James A., Dodd, Paul E., Paillet, Philippe, Ferlet-Cavrois, VÉronique

Journal:

IEEE Transactions on Nuclear Science

Année:

2008

Langue:

english

Fichier:

PDF, 1.83 MB

english, 2008

13

Challenges in hardening technologies using shallow-trench isolation

Shaneyfelt, M.R., Dodd, P.E., Draper, B.L., Flores, R.S.

Journal:

IEEE Transactions on Nuclear Science

Année:

1998

Langue:

english

Fichier:

PDF, 1.25 MB

english, 1998

14

Statistical analysis of network traffic for class of service in packet-switched networks

Shaneyfelt, B.E., Wu, T.-H.

Journal:

IEEE Journal on Selected Areas in Communications

Année:

1988

Langue:

english

Fichier:

PDF, 1.04 MB

english, 1988

15

Single-Event Upsets and Distributions in Radiation-Hardened CMOS Flip-Flop Logic Chains

Dodd, Paul E., Shaneyfelt, Marty R., Flores, Richard S., Schwank, James R., Hill, Thomas A., McMorrow, Dale, Vizkelethy, Gyorgy, Swanson, Scot E., Dalton, Scott M.

Journal:

IEEE Transactions on Nuclear Science

Année:

2011

Langue:

english

Fichier:

PDF, 1.43 MB

english, 2011

16

Radiation Effects on Ytterbium- and Ytterbium/Erbium-Doped Double-Clad Optical Fibers

Girard, S., Ouerdane, Y., Tortech, B., Marcandella, C., Robin, T., Cadier, B., Baggio, J., Paillet, P., Ferlet-Cavrois, V., Boukenter, A., Meunier, J.-P., Schwank, J. R., Shaneyfelt, M. R., Dodd, P. E

Journal:

IEEE Transactions on Nuclear Science

Année:

2009

Langue:

english

Fichier:

PDF, 746 KB

english, 2009

17

New Insights Into Single Event Transient Propagation in Chains of Inverters—Evidence for Propagation-Induced Pulse Broadening

Ferlet-Cavrois, V., Paillet, P., McMorrow, D., Fel, N., Baggio, J., Girard, S., Duhamel, O., Melinger, J. S., Gaillardin, M., Schwank, J. R., Dodd, P. E., Shaneyfelt, M. R., Felix, J. A.

Journal:

IEEE Transactions on Nuclear Science

Année:

2007

Langue:

english

Fichier:

PDF, 927 KB

english, 2007

18

Current and Future Challenges in Radiation Effects on CMOS Electronics

Dodd, P. E., Shaneyfelt, M. R., Schwank, J. R., Felix, J. A.

Journal:

IEEE Transactions on Nuclear Science

Année:

2010

Langue:

english

Fichier:

PDF, 1.35 MB

english, 2010

19

Radiation Hardness Assurance Testing of Microelectronic Devices and Integrated Circuits: Test Guideline for Proton and Heavy Ion Single-Event Effects

Schwank, J. R., Shaneyfelt, M. R., Dodd, P. E.

Journal:

IEEE Transactions on Nuclear Science

Année:

2013

Langue:

english

Fichier:

PDF, 1.60 MB

english, 2013

20

Impact of technology trends on SEU in CMOS SRAMs

Dodd, P.E., Sexton, F.W., Hash, G.L., Shaneyfelt, M.R., Draper, B.L., Farino, A.J., Flores, R.S.

Journal:

IEEE Transactions on Nuclear Science

Année:

1996

Langue:

english

Fichier:

PDF, 985 KB

english, 1996

21

[IEEE 2004 IEEE Radiation Effects Data Workshop - Atlanta, GA, USA (22 July 2004)] 2004 IEEE Radiation Effects Data Workshop (IEEE Cat. No.04TH8774) - Effect of passivation on the enhanced low dose rate sensitivity of National LM124 operational amplifiers

Seiler, J.E., Platteter, D.G., Dunham, G.W., Pease, R.L., Maher, M.C., Shaneyfelt, M.R.

Année:

2004

Langue:

english

Fichier:

PDF, 599 KB

english, 2004

22

[IEEE International Reliability Physics Symposium - Dallas, TX, USA (30 March-4 April 2003)] 2003 IEEE International Reliability Physics Symposium Proceedings, 2003. 41st Annual. - Neutron-induced latchup in SRAMs at ground level

Dodd, P.E., Shaneyfelt, M.R., Schwank, J.R., Hash, G.L.

Année:

2003

Langue:

english

Fichier:

PDF, 367 KB

english, 2003

23

Effects of Angle of Incidence on Proton and Neutron-Induced Single-Event Latchup

Schwank, J. R., Shaneyfelt, M. R., Baggio, J., Dodd, P. E., Felix, J. A., Ferlet-Cavrois, V., Paillet, P., Lum, G. K., Girard, S., Blackmore, E.

Journal:

IEEE Transactions on Nuclear Science

Année:

2006

Langue:

english

Fichier:

PDF, 753 KB

english, 2006

24

Radiation Response of a Gate-All-Around Silicon Nano-Wire Transistor

Draper, Bruce, Okandan, Murat, Shaneyfelt, Marty

Journal:

IEEE Transactions on Nuclear Science

Année:

2009

Langue:

english

Fichier:

PDF, 1.36 MB

english, 2009

25

[IEEE Workshop Record 1992 IEEE Radiation Effects Data Workshop - New Orleans, LA, USA (14 July 1992)] Workshop Record 1992 IEEE Radiation Effects Data Workshop - Radiation characterization of a Monolithic nuclear event detector

Hash, G.L., Schwank, J.R., Shaneyfelt, M.R., Hughes, K.L., Connors, M.P., Swonger, J.W., van Vonno, N.W., Martin, R.L.

Année:

1992

Langue:

english

Fichier:

PDF, 366 KB

english, 1992

26

[IEEE IEEE International Electron Devices Meeting - San Francisco, CA, USA (8-11 Dec. 2002)] Digest. International Electron Devices Meeting, - Neutron-induced soft errors, latchup, and comparison of SER test methods for SRAM technologies

Dodd, P.E., Shaneyfelt, M.R., Schwank, J.R., Hash, G.L.

Année:

2002

Langue:

english

Fichier:

PDF, 315 KB

english, 2002

27

films

Warren, W. L., Fleetwood, D. M., Shaneyfelt, M. R., Winokur, P. S., Devine, R. A. B.

Journal:

Physical Review B

Année:

1994

Langue:

english

Fichier:

PDF, 199 KB

english, 1994

28

[IEEE 2008 European Conference on Radiation and Its Effects on Components and Systems (RADECS) - Jyvaskyla, Finland (2008.09.10-2008.09.12)] 2008 European Conference on Radiation and Its Effects on Components and Systems - A new technique for SET pulse width measurement in chains of inverters using pulsed laser irradiation

Ferlet-Cavrois, V., McMorrow, D., Kobayashi, D., Fel, N., Melinger, J. S., Paillet, P., Pouget, V., Essely, F., Baggio, J., Girard, S., Flores, R. S., Schwank, J. R., Dodd, P. E., Shaneyfelt, M. R., H

Année:

2008

Langue:

english

Fichier:

PDF, 606 KB

english, 2008

29

[IEEE 2007 9th European Conference on Radiation and Its Effects on Components and Systems (RADECS 2007) - Deauville, France (2007.09.10-2007.09.14)] 2007 9th European Conference on Radiation and Its Effects on Components and Systems - Test procedures for proton-induced single event latchup in space environments

Felix, James A., Schwank, James R., Shaneyfelt, Marty R., Baggio, Jacques, Paillet, Philippe, Ferlet-Cavrois, Veronique, Dodd, Paul E., Girard, Sylvain, Blackmore, Ewart W.

Année:

2007

Langue:

english

Fichier:

PDF, 738 KB

english, 2007

30

Mapping of Radiation-Induced Resistance Changes and Multiple Conduction Channels in ${\rm TaO}_{\rm x}$ Memristors

Hughart, David R., Pacheco, Jose L., Lohn, Andrew J., Mickel, Patrick R., Bielejec, Edward, Vizkelethy, Gyorgy, Doyle, Barney L., Wolfley, Steven L., Dodd, Paul E., Shaneyfelt, Marty R., McLain, Micha

Journal:

IEEE Transactions on Nuclear Science

Année:

2014

Langue:

english

Fichier:

PDF, 903 KB

english, 2014

31

2001 IEEE nuclear and space radiation effects conference (NSREC) general chairman's comments

Shaneyfelt, M.R.

Journal:

IEEE Transactions on Nuclear Science

Année:

2001

Langue:

english

Fichier:

PDF, 20 KB

english, 2001

32

Analysis of TID Process, Geometry, and Bias Condition Dependence in 14-nm FinFETs and Implications for RF and SRAM Performance

King, M. P., Wu, X., Eller, M., Samavedam, S., Shaneyfelt, M. R., Silva, A. I., Draper, B. L., Rice, W. C., Meisenheimer, T. L., Felix, J. A., Zhang, E. X., Haeffner, T. D., Ball, D. R., Shetler, K. J

Journal:

IEEE Transactions on Nuclear Science

Année:

2017

Langue:

english

Fichier:

PDF, 1.15 MB

english, 2017

33

When is a guideline not a guideline? The devil is in the details

Cosgrove, Lisa, Shaughnessy, Allen F, Shaneyfelt, Terrence

Journal:

BMJ Evidence-Based Medicine

Année:

2018

Langue:

english

Fichier:

PDF, 231 KB

english, 2018

34

Radiation-induced defect centers in bonded and etchback SOI materials

W.L. Warren, J.R. Schwank, M.R. Shaneyfelt, D.M. Fleetwood, P.S. Winokur, W.P. Maszara, J.B. McKitterick

Journal:

Microelectronic Engineering

Année:

1993

Langue:

english

Fichier:

PDF, 332 KB

english, 1993

35

Defect centers in chemical-mechanical polished MOS oxides

M.R. Shaneyfelt, W.L. Warren, D.L. Hetherington, R.P. Timon, P.J. Resnick, P.S. Winokur

Journal:

Microelectronic Engineering

Année:

1995

Langue:

english

Fichier:

PDF, 332 KB

english, 1995

36

Radiation effects microscopy for failure analysis of microelectronic devices

G. Vizkelethy, B.L. Doyle, D.K. Brice, P.E. Dodd, M.R. Shaneyfelt, J.R. Schwank

Journal:

Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Année:

2005

Langue:

english

Fichier:

PDF, 391 KB

english, 2005

37

Generation of metastable electron traps in the near interfacial region of SOI buried oxides by ion implantation and their effect on device properties

J.R Schwank, D.M Fleetwood, H.D Xiong, M.R Shaneyfelt, B.L Draper

Journal:

Microelectronic Engineering

Année:

2004

Langue:

english

Fichier:

PDF, 217 KB

english, 2004

38

Analysis of heavy-ion induced charge collection mechanisms in SOI circuits

J.R Schwank, V Ferlet-Cavrois, P.E Dodd, M.R Shaneyfelt, G Vizkelethy, P Paillet, O Flament

Journal:

Solid-State Electronics

Année:

2004

Langue:

english

Fichier:

PDF, 1.05 MB

english, 2004

39

Silicon-on-insulator non-volatile field-effect transistor memory

J.R. Schwank, M.R. Shaneyfelt, T.L. Meisenheimer, B.L. Draper, K. Vanhesden, D.M. Fleetwood

Journal:

Microelectronic Engineering

Année:

2001

Langue:

english

Fichier:

PDF, 104 KB

english, 2001

40

The Effects of Neutron Energy and High-Z Materials on Single Event Upsets and Multiple Cell Upsets

Sierawski, Brian D., Warren, Kevin M., Mendenhall, Marcus H., Dodds, Nathaniel A., Clemens, Michael Andrew, Weller, Robert A., Reed, Robert A., Dodd, Paul E., Shaneyfelt, Marty R., Schwank, James R.

Journal:

IEEE Transactions on Nuclear Science

Année:

2011

Langue:

english

Fichier:

PDF, 837 KB

english, 2011

41

Total dose hardness assurance testing using laboratory radiation sources

Paillet, P., Schwank, J.R., Shaneyfelt, M.R., Ferlet-Cavrois, V., Jones, R.L., Flament, O., Blackmore, E.W.

Journal:

IEEE Transactions on Nuclear Science

Année:

2003

Langue:

english

Fichier:

PDF, 687 KB

english, 2003

42

Comparison of charge yield in MOS devices for different radiation sources

Paillet, P., Schwank, J.R., Shaneyfelt, M.R., Ferlet-Cavrois, V., Jones, R.L., Flament, O., Blackmore, E.W.

Journal:

IEEE Transactions on Nuclear Science

Année:

2002

Langue:

english

Fichier:

PDF, 382 KB

english, 2002

43

Effects of Moisture on Radiation-Induced Degradation in CMOS SOI Transistors

Shaneyfelt, Marty R., Schwank, James R., Dodd, Paul E., Hill, Tom A., Dalton, Scott M., Swanson, Scot

Journal:

IEEE Transactions on Nuclear Science

Année:

2010

Langue:

english

Fichier:

PDF, 324 KB

english, 2010

44

Radiation effects in SOI technologies

Schwank, J.R., Ferlet-Cavrois, V., Shaneyfelt, M.R., Paillet, P., Dodd, P.E.

Journal:

IEEE Transactions on Nuclear Science

Année:

2003

Langue:

english

Fichier:

PDF, 1.58 MB

english, 2003

45

Worst-case bias during total dose irradiation of SOI transistors

Ferlet-Cavrois, V., Colladant, T., Paillet, P., Leray, J.L., Musseau, O., Schwank, J.R., Shaneyfelt, M.R., Pelloie, J.L., du Port de Poncharra, J.

Journal:

IEEE Transactions on Nuclear Science

Année:

2000

Langue:

english

Fichier:

PDF, 133 KB

english, 2000

46

BUSFET-a radiation-hardened SOI transistor

Schwank, J.R., Shaneyfelt, M.R., Draper, B.L., Dodd, P.E.

Journal:

IEEE Transactions on Nuclear Science

Année:

1999

Langue:

english

Fichier:

PDF, 627 KB

english, 1999

47

Condensation reactions of a comenaldehyde derivative

James H. Looker, Duane L. Shaneyfelt, Wayne Halfar

Journal:

Journal of Heterocyclic Chemistry

Année:

1979

Fichier:

PDF, 120 KB

1979

48

Oxide modification due to high temperature processing of Si/SiO2/Si structures

R.A.B. Devine, W.L. Warren, M.R. Shaneyfelt, D.M. Fleetwood, B. Aspar

Journal:

Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Année:

1994

Langue:

english

Fichier:

PDF, 415 KB

english, 1994

49

Investigation of body-tie effects on ion beam induced charge collection in silicon-on-insulator FETs using the Sandia nuclear microprobe

David S. Walsh, P.E. Dodd, M.R. Shaneyfelt, J.R. Schwank

Journal:

Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Année:

2001

Langue:

english

Fichier:

PDF, 290 KB

english, 2001

50

Anomalous charge collection from silicon-on-insulator structures

G. Vizkelethy, P.E. Dodd, J.R. Schwank, M.R. Shaneyfelt, D.S. Walsh, F.D. McDaniel, B.L. Doyle

Journal:

Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Année:

2003

Langue:

english

Fichier:

PDF, 130 KB

english, 2003